• DocumentCode
    57903
  • Title

    Global-Sensitivity-Based Theoretical Analysis and Fast Prediction of Traveling Waves With Respect to Fault Resistance on HVDC Transmission Lines

  • Author

    Jingmei Guo ; Gang Wang ; Yuansheng Liang ; Dehui Zeng

  • Author_Institution
    Sch. of Electr. Power Eng., South China Univ. of Technol., Guangzhou, China
  • Volume
    30
  • Issue
    4
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    2007
  • Lastpage
    2016
  • Abstract
    The fault resistance is the key factor to affect the travelling waves and the performance of travelling-wave-based protections on HVDC transmission lines. In order to explain accurately the impacts of the fault resistance to travelling waves in theory and improve computational efficiency on the existing data of the travelling waves at given fault conditions, this paper proposed a global-sensitivity-based method to fast predict the new travelling waves with any other fault resistance. This method was built on the actual HVDC project topology and its frequency-dependent nature, and derived by the infinite-Taylor series in the phase and frequency domain, and then realized by a rational fitting technique with an order estimation scheme for the conversion to the time domain, which would overcome three limitations compared with conventional sensitivity methods. Numerical examples show that the proposed method has a huge advantage in saving CPU time to predict travelling waves in the network with any fault resistance increment over traditional simulations.
  • Keywords
    HVDC power transmission; power transmission lines; CPU time; HVDC transmission lines; fault resistance; global-sensitivity-based theoretical analysis; travelling waves; Admittance; Circuit faults; Electrodes; HVDC transmission; Radio frequency; Resistance; Sensitivity; Fault resistance; HVDC transmission lines; frequency-dependent nature; global sensitivity; travelling waves;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2015.2431318
  • Filename
    7104160