Title :
A Novel Error-Detection Mechanism for Digital Circuits Using Markov Random Field Modelling
Author :
Anwer, Jahanzeb ; Khalid, Usman ; Singh, Navab ; Hamid, Nor Hisham ; Asirvadam, Vijanth S.
Author_Institution :
Electr. & Electron. Eng. Dept., Univ. Teknol. PETRONAS, Tronoh, Malaysia
Abstract :
The error-sensitivity of nanoscale circuits is an extremely important issue in electronic industry these days. The reason is the high susceptibility of electronic circuits to noise at the nanoscale level. Markov Random Field (MRF) modelling is one approach to achieve noise-tolerance in integrated circuit design. In this paper, we have designed an error-detection mechanism for digital circuits based on Joint Probability analysis of Markov random Field (MRF) networks. The circuit and test bench design has been carried out in the software Xilinx ISE 8.1i. Our error-detection mechanism is an excellent solution for digital system designs where space is not a critical factor but reliability of system matters a lot.
Keywords :
Markov processes; digital circuits; error detection; probability; reliability; Markov random field modelling; Markov random field network; digital circuit; digital system design; error-detection mechanism; joint probability analysis; novel error detection mechanism; software Xilinx ISE 8.1i; system reliability; testbench design; Integrated circuit modeling; Joints; Logic gates; Markov random fields; Nanoscale devices; Noise; Reliability; Markov random field; errordetection module; joint probability;
Conference_Titel :
Computational Intelligence and Communication Networks (CICN), 2012 Fourth International Conference on
Conference_Location :
Mathura
Print_ISBN :
978-1-4673-2981-1
DOI :
10.1109/CICN.2012.30
