• DocumentCode
    580060
  • Title

    Object oriented mutation testing: A survey

  • Author

    Bashir, Muhammad Bilal ; Nadeem, Aamer

  • Author_Institution
    Center for Software Dependability, Mohammad Ali Jinnah Univ., Islamabad, Pakistan
  • fYear
    2012
  • fDate
    8-9 Oct. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Mutation testing is a fault based testing technique that measures the effectiveness of test case suite and helps to generate test cases that have potential of identifying real faults in the program. Faults are injected using a pre-defined set of mutation operators. Object oriented paradigm is known for its salient features that make it different from traditional programming paradigms. We find traditional mutation operators insufficient and incapable of introducing faults in object oriented features like encapsulation, inheritance and polymorphism. This paper presents a survey on object oriented mutation testing to find out the issues mutation testing is currently facing and solutions that have been proposed to cater those issues. We have studied various techniques proposed till now and tools that are developed for the aid of testers to perform mutation testing. We analyze these techniques considering the issues in object oriented mutation testing against the solutions they have offered. Our survey concludes that selective mutation testing can reduce the computational cost and experiments on large scale can help identifying potential mutation operators to avoid generation of equivalent mutants.
  • Keywords
    data encapsulation; fault diagnosis; inheritance; object-oriented methods; program testing; software fault tolerance; encapsulation; fault based testing technique; fault injection; inheritance; mutation operators; object oriented feature; object oriented mutation testing; object oriented paradigm; polymorphism; program fault identification; programming paradigm; test case generation; test case suite effectiveness; Computational efficiency; Graphical user interfaces; Integrated circuits; Java; Runtime; Software; Testing; mutation operators; mutation testing; object oriented paradigm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies (ICET), 2012 International Conference on
  • Conference_Location
    Islamabad
  • Print_ISBN
    978-1-4673-4452-4
  • Type

    conf

  • DOI
    10.1109/ICET.2012.6375480
  • Filename
    6375480