• DocumentCode
    580073
  • Title

    Flexible cache error protection using an ECC FIFO

  • Author

    Doe Hyun Yoon ; Erez, M.

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2009
  • fDate
    14-20 Nov. 2009
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    We present ECC FIFO, a mechanism enabling two-tiered last-level cache error protection using an arbitrarily strong tier-2 code without increasing on-chip storage. Instead of adding redundant ECC information to each cache line, our ECC FIFO mechanism off-loads the extra information to off-chip DRAM. We augment each cache line with a tier-1 code, which provides error detection consuming limited resources. The redundancy required for strong protection is provided by a tier-2 code placed in off-chip memory. Because errors that require tier-2 correction are rare, the overhead of accessing DRAM is unimportant. We show how this method can save 15-25% and 10-17% of on-chip cache area and power respectively while minimally impacting performance, which decreases by 1% on average across a range of scientific and consumer benchmarks.
  • Keywords
    DRAM chips; cache storage; error correction; error detection; ECC FIFO; ECC information; cache line; error detection; flexible cache error protection; off-chip DRAM; off-chip memory; on-chip cache area; on-chip storage; strong tier-2 code; tier-1 code; tier-2 correction; two-tiered last-level cache error protection; error correction; last-level caches; reliability; soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computing Networking, Storage and Analysis, Proceedings of the Conference on
  • Conference_Location
    Portland, OR
  • Type

    conf

  • DOI
    10.1145/1654059.1654109
  • Filename
    6375521