DocumentCode :
580906
Title :
Dispatching rule considering time-constraints on processes for semiconductor wafer fabrication facility
Author :
Li, L. ; Li, Y.F. ; Sun, Z.J.
Author_Institution :
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear :
2012
fDate :
20-24 Aug. 2012
Firstpage :
407
Lastpage :
412
Abstract :
There are many constraints in a semiconductor wafer fabrication facility (fab), especially time-constraints on processes. This paper gives a dispatching rule considering time-constraints (DRTC) that makes use of such information as due date of a job, workload of a machine, occupation time of a job on a machine, and time constraint of a process. The relative importance of each category is determined by weighting parameters, which are set by learning simulation samples with a backward propagation neural network (BPNN). A real fab simulation model is used to demonstrate the proposed method. The simulation results indicate that DRTC is superior to common rules (such as FIFO, EDD, CR and SRPT ) and the existing dispatching rule used in the fab (called as PRIOR) with more movements of WIP and higher time-constraints satisfaction proportion.
Keywords :
dispatching; learning (artificial intelligence); neural nets; production engineering computing; semiconductor industry; BPNN; DRTC; WIP; backward propagation neural network; dispatching rule considering time-constraints; job occupation time; machine workload; process time constraint; real fab simulation model; semiconductor wafer fabrication facility; simulation sample learning; time-constraint satisfaction proportion; weighting parameters; Bismuth; Dispatching; Educational institutions; Indexes; Sputtering; Time factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering (CASE), 2012 IEEE International Conference on
Conference_Location :
Seoul
ISSN :
2161-8070
Print_ISBN :
978-1-4673-0429-0
Type :
conf
DOI :
10.1109/CoASE.2012.6386370
Filename :
6386370
Link To Document :
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