DocumentCode :
580944
Title :
A robust general constrained random pattern generator for constraints with variable ordering
Author :
Bo-Han Wu ; Chung-Yang Huang
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2012
fDate :
5-8 Nov. 2012
Firstpage :
109
Lastpage :
114
Abstract :
Constrained random verification (CRV) methodology has been identified as an efficient solution to functional verification challenges. In practical cases, it is required to implement constraints with variable ordering to put essential efforts on cared patterns. However, handling constraints with variable ordering may encounter performance degradation of pattern generation speed and distribution. To resolve these challenges, we provide a preprocessing technique to analyze solution space by adaptively splitting ranges of variables and prove the feasibility of each subspace. This analysis allows us to perform effective range-reduction to enhance pattern generation speed and ensure the desired distribution. From the experimental results, our framework outperforms a state-of-art tool with 10X speedup in average and retains better stability of performance with the increase of number of variable orders.
Keywords :
automatic test pattern generation; integrated circuit testing; random processes; constrained random verification methodology; functional verification; preprocessing technique; robust general constrained random pattern generator; solution space; variable ordering; variable range adaptive splitting; Data preprocessing; Engines; Force; Generators; Robustness; Runtime; Stability analysis; constrained random verification; evenness; satisfiability problem; variable ordering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2012 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Type :
conf
Filename :
6386596
Link To Document :
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