• DocumentCode
    580946
  • Title

    TRIAD: A triple patterning lithography aware detailed router

  • Author

    Lin, Yen-Hung ; Yu, Bei ; Pan, David Z. ; Li, Yih-Lang

  • Author_Institution
    Dept. of Comput. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    5-8 Nov. 2012
  • Firstpage
    123
  • Lastpage
    129
  • Abstract
    TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG. This work proposes a token graph-embedded conflict graph (TECG) to facilitate the TPL conflict detection while maintaining high coloring-flexibility. We then develop a TPL aware detailed router (TRIAD) by applying TECG to a gridless router with the TPL stitch generation. Compared to a greedy coloring approach, experimental results indicate that TRIAD generates no conflicts and few stitches with shorter wirelength at the cost of 2.41× of runtime.
  • Keywords
    graph colouring; integrated circuit design; lithography; network routing; TECG application; TPL conflict detection; TPL stitch generation; TPL-friendly detailed routers; TRIAD; greedy coloring approach; gridless router; high coloring-flexibility; token graph-embedded conflict graph; triple patterning lithography aware detailed router; Color; Image edge detection; Joining processes; Layout; Merging; Routing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2012 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Type

    conf

  • Filename
    6386598