DocumentCode :
580946
Title :
TRIAD: A triple patterning lithography aware detailed router
Author :
Lin, Yen-Hung ; Yu, Bei ; Pan, David Z. ; Li, Yih-Lang
Author_Institution :
Dept. of Comput. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2012
fDate :
5-8 Nov. 2012
Firstpage :
123
Lastpage :
129
Abstract :
TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG. This work proposes a token graph-embedded conflict graph (TECG) to facilitate the TPL conflict detection while maintaining high coloring-flexibility. We then develop a TPL aware detailed router (TRIAD) by applying TECG to a gridless router with the TPL stitch generation. Compared to a greedy coloring approach, experimental results indicate that TRIAD generates no conflicts and few stitches with shorter wirelength at the cost of 2.41× of runtime.
Keywords :
graph colouring; integrated circuit design; lithography; network routing; TECG application; TPL conflict detection; TPL stitch generation; TPL-friendly detailed routers; TRIAD; greedy coloring approach; gridless router; high coloring-flexibility; token graph-embedded conflict graph; triple patterning lithography aware detailed router; Color; Image edge detection; Joining processes; Layout; Merging; Routing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2012 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Type :
conf
Filename :
6386598
Link To Document :
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