DocumentCode
580954
Title
On the computation of criticality in statistical timing analysis
Author
Ramprasath, S. ; Vasudevan, V.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
fYear
2012
fDate
5-8 Nov. 2012
Firstpage
172
Lastpage
179
Abstract
Due to the statistical nature of gate delays in current day technologies, measures such as path criticality and node/edge criticality are required for timing optimization. Node criticalities are usually computed using the complementary path delay. In order to speed up computations, it has been recently proposed that the circuit delay be used instead. In this paper, we show that there is a monotonic relationship between the node criticalities computed using the circuit delay and the complementary delay. They are not equal, but they can be used interchangeably. We discuss the sources of error in this computation and propose methods for more accurate computations. We also introduce a measure that is very easy to compute and is an approximate indicator of criticality. Since it is easy to compute, it can also be used effectively for pruning the number of edges involved in criticality computations thus improving the speed of criticality computations. The speedup obtained can be as large as an order of magnitude for some of larger circuits in the ISCAS benchmarks.
Keywords
circuit optimisation; delays; network analysis; statistical analysis; ISCAS benchmarks; circuit delay; complementary path delay; gate delays; monotonic relationship; node-edge criticality; path criticality; statistical timing analysis; timing optimization; Adders; Benchmark testing; Delay; Equations; Logic gates; Random variables; Criticality; Statistical distance; Statistical timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2012 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Type
conf
Filename
6386606
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