DocumentCode
580980
Title
Opening: Introduction to CAD contest at ICCAD 2012: CAD contest
Author
Jiang, Iris Hui-Ru ; Li, Zhuo ; Li, Yih-Lang
Author_Institution
Dept. of Electronics Engineering and Inst. of Electronics, National Chiao Tung University, Hsinchu 30010, Taiwan
fYear
2012
fDate
5-8 Nov. 2012
Firstpage
341
Lastpage
341
Abstract
Contests and their benchmarks have become an important driving force to push our EDA domain forward in different areas lately, such as ISPD, TAU, DAC contests. To encourage better research development on timely and practical EDA problems across all domains, a new international CAD Contest is held this year under the joint sponsorship of the IEEE CEDA and Ministry of Education (MOE) of Taiwan. Three contest problems on functional ECO, placement, and litho hotspot identification are announced this year and run by industry experts from Cadence, IBM and Mentor Graphics.
Keywords
Benchmark testing; Computer science; Design automation; Educational institutions; Force; Integrated circuits; Iris; Engineering change order; lithography; placement;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2012 IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Type
conf
Filename
6386632
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