Title :
Exploring the worst-case timing of Ethernet AVB for industrial applications
Author :
Diemer, Jonas ; Rox, Jonas ; Ernst, Rolf ; Chen, Feng ; Kremer, Karl-Theo ; Richter, Kai
Author_Institution :
Inst. of Comput. & Network Eng., Tech. Univ. Braunschweig, Braunschweig, Germany
Abstract :
Predictable and low-latency communication timing is one of the major challenges for employing Ethernet-based networks in industrial automation. The evolving Ethernet AVB standard appears to be a promising architecture, as it provides mechanisms for predictable timing with standard Ethernet hardware. However, the worst-case timing of Ethernet AVB still has to be evaluated. In this paper, we analyze the timing of Ethernet AVB using both simulation and a formal worst-case analysis based on Compositional Performance Analysis known from embedded computing systems. We investigate two industrial scenarios, a typical line topology and a more complex two-level network, and compare the results from analysis and simulation. This allows us get a good indication of the applicability of the current Ethernet AVB with respect to predictable low-latency timing in industrial automation networks. We also gain an understanding of the benefits and limitations of formal Compositional Performance Analysis compared to simulation in this context.
Keywords :
computer network performance evaluation; embedded systems; industrial control; local area networks; telecommunication network topology; timing; video communication; Ethernet AVB standard; Ethernet-based networks; audio-video bridging standard; complex two-level network; compositional performance analysis; embedded computing systems; formal compositional performance analysis; formal worst-case analysis; industrial applications; industrial automation networks; line topology; low-latency communication timing; predictable timing; standard Ethernet hardware; worst-case timing; Artificial neural networks; Bridges; Context; Context modeling; Usability;
Conference_Titel :
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-2419-9
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2012.6389389