Title :
A method of analyzing image distortion based on conjugate nodal plane
Author :
Chun-ming, Zhang ; Yong-chun, Xie
Author_Institution :
Beijing Inst. of Control & Eng., Beijing, China
Abstract :
The imaging model of an optical camera without image aberration can be equivalently depicted by its conjugate nodal plane model. A pinhole camera model itself neglects aberration of corresponding equivalent model, and also fails to represent shift error of flat glass, tilt error of optical axis as well as image aberration of an actual optical system, all of these four factors give rise to image distortion. Based on this, utilizing the property of conjugate nodal plane, an geometry model of image distortion is presented. This model, which fits for pinhole cameras with chromatic aberration corrected, can analyze symmetric and asymmetric image distortion. The simulation of an actual optical system indicates that the relative radical distortion and relevant angle error both calculated by this model appears in the range of rational design parameters. In this model, four unknown parameters needed to be recognized are principal relevant parameters, tilt angle of optical axis and axial spherical aberration of flat glass. Theoretically, this geometric model can be used to correct image distortion, aiming at better precision of calibration of image distortion.
Keywords :
aberrations; image processing; optical distortion; angle error; asymmetric image distortion; axial spherical aberration; chromatic aberration correction; conjugate nodal plane model; flat glass shift error; image aberration; image distortion analysis; image distortion geometry model; optical axis tilt error; optical camera imaging model; optical system; pinhole camera model; symmetric image distortion; Adaptive optics; Cameras; Electronic mail; Glass; Optical distortion; Optical imaging; Space technology; A Pinhole Camera; Axial Spherical Aberration; Chromatic Aberration; Conjugate Nodal Plane; Conjugate Principle Plane; Image Distortion;
Conference_Titel :
Control Conference (CCC), 2012 31st Chinese
Conference_Location :
Hefei
Print_ISBN :
978-1-4673-2581-3