Title :
How to Exploit Marker Orientation for SIFT Image Matching
Author :
Park, Gyeon-Mi ; Hwang, Hae-lyen ; Cho, Hwan-Gue
Author_Institution :
Center of U-Port IT Res. & Educ., Pusan Nat. Univ., Busan, South Korea
Abstract :
In computer vision, it is very important to obtain reliable corresponding feature points. However, it is not easy to locate the corresponding feature points exactly considering scaling, lighting, viewpoints, etc. Lots of SIFT methods apply the invariant to image scale and rotation and change in illumination, which is due to the feature vector extracted from the corners or edges of the object. However, The SIFT method cannot find feature points easily when the brightness value of the area is similar since we extract feature points along the edges. In addition, this algorithm determined correspondences by vector difference between local descriptors. In this paper, we propose a marker design and a placement way for improving the performance regarding the detection and matching of feature points. The shape of the markers used in the proposed method is formed in a semicircle in order to detect the predominant direction vector by the standard SIFT algorithm depending on the direction of placement regarding the marker. Also, we propose a key point matched way, which is a combination of each features predominant orientation and nearest neighbor. We examined the features for point detection and correspondence matching. The experimental results demonstrated that the proposed method is more accurate and effective compared to the current method.
Keywords :
brightness; computer vision; feature extraction; image matching; lighting; SIFT image matching; brightness value; computer vision; correspondence matching; feature points; illumination; marker orientation; placement direction; point detection; vector difference; Algorithm design and analysis; Brightness; Detectors; Feature extraction; Histograms; Robustness; Vectors; Image matching; correspondences matching; feature points detection;
Conference_Titel :
Computer and Information Technology (CIT), 2012 IEEE 12th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4673-4873-7
DOI :
10.1109/CIT.2012.147