Title :
An Efficient Hardware Random Number Generator Based on the MT Method
Author :
Li, Yuan ; Jiang, Jiang ; Cheng, Hanqiang ; Zhang, Minxuan ; Wei, Shaojun
Author_Institution :
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Mersenne Twister (MT) algorithm is one of the most widely used long-period uniform random number generators. In this paper, we present a novel and efficient hardware architecture for MT method. Our design is implemented on a Xilinx XC6VLX240T-1 FPGA device at 450 MHz. It takes up 0.1% of the device and produces 450 million samples per second, which is 2.25 times faster than a dedicated software version running on a 2.67-GHz Intel core i5 multi-core processor. A dedicated 3R/1W RAM structure is also proposed. It is capable of providing 3 reads and 1 write concurrently in a single clock cycle and is the key component for the entire system to achieve 1 sample-per-cycle throughput. The architecture is also implemented on different FPGA devices. Experimental results show that our generator is superior to those existing architectures reported in the literatures in both performance and hardware complexity. The samples generated by our design are verified via the standard statistics testing suites of Diehard and TestU01.
Keywords :
circuit complexity; clocks; computer architecture; field programmable gate arrays; logic design; random number generation; random-access storage; statistical testing; 3R/1W RAM structure; Diehard suites; MT method; Mersenne twister algorithm; TestU01 suites; Xilinx XC6VLX240T-1 FPGA device; clock cycle; hardware architecture; hardware complexity; hardware random number generator; long-period uniform random number generator; sample-per-cycle throughput; standard statistical testing suites; Clocks; Computer architecture; Field programmable gate arrays; Generators; Hardware; Random access memory; Transforms; 3R/1W RAM; FPGA; Hardware Random Number Generator; Mersenne Twister Method;
Conference_Titel :
Computer and Information Technology (CIT), 2012 IEEE 12th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4673-4873-7
DOI :
10.1109/CIT.2012.208