DocumentCode :
583182
Title :
Test effectiveness index: Integrating product metrics with process metrics
Author :
Zhang, Yan ; Zhao, Xuying ; Zhang, Xiaokun ; Zhang, Tian
fYear :
2012
fDate :
27-31 May 2012
Firstpage :
54
Lastpage :
57
Abstract :
Defect measurement is an important method in the improvement of software quality. Recent approaches of defect measurement are inappropriate to small software organizations by reason of their intricacy. This paper gives a simple approach of defect measurement, which integrates the power of product metrics with process metrics, i.e., it can not only detect the defect-prone modules, but also find the problems in the software process. This approach uses the results of successive two rounds of testing to create the test effectiveness index constructively. A case study is conducted and the results indicate that the defect-prone modules can be identified and problems of testing process can be discovered by test effectiveness index.
Keywords :
program testing; software metrics; software quality; defect measurement; defect-prone modules; process metrics; product metrics integration; software organizations; software process; software quality; test effectiveness index; Indexes; Organizations; Software; Software engineering; Software measurement; Testing; defect measurement; process metric; small organization; test effectiveness index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Cyber Technology in Automation, Control, and Intelligent Systems (CYBER), 2012 IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4673-1420-6
Type :
conf
DOI :
10.1109/CYBER.2012.6392526
Filename :
6392526
Link To Document :
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