DocumentCode
583552
Title
An auto-framing method for stochastic process signals for fault detection by using a hidden Markov model based approach
Author
Lee, Hana ; Lee, Jay H.
Author_Institution
Dept. of Chem. & Biomol. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear
2012
fDate
17-21 Oct. 2012
Firstpage
834
Lastpage
839
Abstract
There exist enormous amounts of newly information at each sampling time from processing equipment. Even though the information is mightily important to detect and diagnose the state of the equipment, their use is limited by the cost to gather, examine, and analyze them. Thus, there appears motivations to divide stochastic time-series signals into frames of different patterns and store only relevant statistical information for each frame. This so called “data framing” leads to significant data compression for easy storage and analysis. However, through visual inspection, the task for “data-framing” is inaccurate as well as cumbersome to perform it. In this work, stochastic signals are generalizaed using a hidden Markov model (HMM) and Markov Jump System (MJS), according to multiple models that switch randomly by underlying Markov chain. The most probable hidden path is reconstructed by using the recursive Expectation-Maximization (EM) algorithms. This optimal path can be one of the criteria for framing and statistical properties of each frame are analyzed and stored at the database. We have demonstrated the effectiveness of the HMM-based approach in auto-framing using realistic processing data from semiconductor industry.
Keywords
data analysis; fault diagnosis; hidden Markov models; stochastic processes; time series; EM algorithms; HMM; MJS; Markov Jump System; auto-framing method; data framing; database; fault detection; hidden Markov model; optimal path; processing equipment; realistic processing data; recursive expectation-maximization algorithms; semiconductor industry; statistical information; statistical properties; stochastic process signals; stochastic time-series signals; visual inspection; Hidden Markov models; Markov processes; Noise; State estimation; Switches; Yttrium; auto-framing; data analysis; feature extraction; hidden Markov model;
fLanguage
English
Publisher
ieee
Conference_Titel
Control, Automation and Systems (ICCAS), 2012 12th International Conference on
Conference_Location
JeJu Island
Print_ISBN
978-1-4673-2247-8
Type
conf
Filename
6393338
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