Session Summary II: Dependable VLSI for Product Reliability

Summary form only given, as follows. This session presents the importance of product quality and reliability from both a customer perspective and VLSI component perspective. DFT technologies ranging from VLSI component design, manufacturing, test to diagnosis and even to product customer site (in-field) test are discussed to help product reliability. Four presentations in this session will cover quality memory test, flash storage in-field test, special ASIC DFT feature design and board/system usage of component level DFT features.