Title :
Accessing Embedded DfT Instruments with IEEE P1687
Author :
Larsson, Erik ; Zadegan, Farrokh Ghani
Author_Institution :
Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
Abstract :
While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non-intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.
Keywords :
design for testability; embedded systems; integrated circuit testing; logic testing; IEEE 1149.1; IEEE P1687; IJTAG; Internal JTAG; Joint Test Action Group standard; embedded DfT instruments; embedded instrumentation; embedded instruments; integrated circuits; on-chip instruments; semiconductor technologies; Clocks; Hip; Instruments; Logic gates; Registers; Schedules; Vectors; IEEE 1149.1; IEEE P1687 IJTAG; embedded instruments;
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
DOI :
10.1109/ATS.2012.74