DocumentCode :
584266
Title :
Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees
Author :
Ye, Fangming ; Zhang, Zhaobo ; Chakrabarty, Krishnendu ; Gu, Xinli
Author_Institution :
ECE Dept., Duke Univ., Durham, NC, USA
fYear :
2012
fDate :
19-22 Nov. 2012
Firstpage :
202
Lastpage :
207
Abstract :
Functional fault diagnosis at board-level is desirable for high-volume production since it improves product yield. However, to ensure diagnosis accuracy and effective board repair, a large number of syndromes must be used. Therefore, the diagnosis cost can be prohibitively high due to the increase in diagnosis time and the complexity of syndrome collection/analysis. We propose an adaptive diagnosis method based on decision trees (DTs). Faulty components are classified according to the discriminative ability of the syndromes in DT training. The diagnosis procedure is constructed as a binary tree, with the most discriminative syndrome as the root and final repair suggestions are available as the leaf nodes of the tree. The syndrome to be collected in the next step is determined based on the observations of syndromes collected thus far in the diagnosis procedure. The number of syndromes required for diagnosis can also be significantly reduced compared to the number of syndromes used for system training. Diagnosis results for two complex boards from industry, currently in volume production, and additional synthetic data highlight the effectiveness of the proposed approach.
Keywords :
decision trees; fault diagnosis; fault trees; adaptive board level functional fault diagnosis; binary tree; board repair; decision trees; diagnosis accuracy; diagnosis cost; diagnosis procedure; diagnosis time; discriminative syndrome; faulty component; high volume production; product yield; syndrome analysis; syndrome collection; Accuracy; Decision trees; Fault diagnosis; Indexes; Maintenance engineering; Manufacturing; Training; adaptive testing; board-level diagnosis; decision tree; functional failure; machine learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
ISSN :
1081-7735
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
Type :
conf
DOI :
10.1109/ATS.2012.48
Filename :
6394200
Link To Document :
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