• DocumentCode
    584267
  • Title

    Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines

  • Author

    Ye, Fangming ; Zhang, Zhaobo ; Chakrabarty, Krishnendu ; Gu, Xinli

  • Author_Institution
    ECE Dept., Duke Univ., Durham, UK
  • fYear
    2012
  • fDate
    19-22 Nov. 2012
  • Firstpage
    208
  • Lastpage
    213
  • Abstract
    Advanced machine learning techniques offer an unprecedented opportunity to increase the accuracy of board-level functional fault diagnosis based on the historical data of successfully repaired boards. However, the training complexity increases significantly in diagnosis systems due to the increasing amount of the historical data. We propose a smart learning method in the diagnosis system using incremental support-vector machines (SVMs). The SVMs updated using incremental learning allow the diagnosis system to quickly adapt to new error observations and provide more accurate fault diagnosis. Two sets of large-scale synthetic data generated from the log information of two complex industrial boards, in volume production, are used to validate the proposed diagnosis approach in terms of training time and diagnosis accuracy over a previously proposed diagnosis system based on simple support-vector machines.
  • Keywords
    electronic engineering computing; fault diagnosis; learning (artificial intelligence); printed circuit design; support vector machines; SVM; board-level functional fault diagnosis; complex industrial board; diagnosis system; error observation; incremental learning; incremental support-vector machine; large-scale synthetic data; machine learning technique; printed circuit board; smart learning method; training complexity; volume production; Accuracy; Fault diagnosis; Kernel; Maintenance engineering; Mathematical model; Support vector machines; Training; board-level diagnosis; functional failure; incremental learning; machine learning; support-vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2012 IEEE 21st Asian
  • Conference_Location
    Niigata
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4673-4555-2
  • Electronic_ISBN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2012.49
  • Filename
    6394201