Session Summary III: Power-Aware Testing: Present and Future

Summary form only given, as follows. Power-aware testing is facing more and more challenges in terms of test power analysis as well as test power management due to the ever-growing gap between functional power and test power for low-power LSI circuits. This special session, presented by top experts from both academia and industry, will provide firsthand information on state-of-the-art solutions as well as insightful perspectives on future R&D directions about power-aware testing. It will help researchers and practitioners alike in advancing poweraware test technologies for low-power LSI circuits, the enabler of all energy-smart electronic devices that are now indispensable in our everyday life.