• DocumentCode
    584269
  • Title

    Why and How Controlling Power Consumption during Test: A Survey

  • Author

    Bosio, A. ; Dilillo, L. ; Girard, P. ; Todri, A. ; Virazel, A.

  • Author_Institution
    LIRMM, Univ. Montpellier 2, Montpellier, France
  • fYear
    2012
  • fDate
    19-22 Nov. 2012
  • Firstpage
    221
  • Lastpage
    226
  • Abstract
    Managing the power consumption of circuits and systems is challenging not only during functional operations but also during manufacturing test. In this paper, we first explain why it is important to control power consumption during test application. We will introduce the basic concepts and discuss issues arising from excessive power dissipation during test. Then, we explain how it is possible to control power consumption during test. We will provide an overview of existing structural and algorithmic solutions for power-aware testing, and we will show how low power circuits can be tested safely without affecting yield and reliability.
  • Keywords
    circuit testing; low-power electronics; power consumption; power control; power supply circuits; algorithmic solution; circuit power consumption management; excessive power dissipation; low power circuit; manufacturing test; power aware testing; power consumption control; test application; Automatic test pattern generation; Clocks; Logic gates; Power demand; Power dissipation; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2012 IEEE 21st Asian
  • Conference_Location
    Niigata
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4673-4555-2
  • Electronic_ISBN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2012.30
  • Filename
    6394204