Author :
Venkataraman, S. ; Aitken, Robert ; Girard, P. ; Nicolici, Nicola ; Xiaoqing Wen
Abstract :
This tutorial discusses the following:Beyond DFT: The Convergence of DFM, Variability, Yield, Diagnosis and Reliability; and Power-Aware Testing and Test Strategies for Low Power Devices.
Keywords :
design for manufacture; design for testability; low-power electronics; reliability; DFM; DFT; low power devices; power-aware testing; reliability; test strategy;
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
