• DocumentCode
    584278
  • Title

    Tutorials

  • Author

    Venkataraman, S. ; Aitken, Robert ; Girard, P. ; Nicolici, Nicola ; Xiaoqing Wen

  • fYear
    2012
  • fDate
    19-22 Nov. 2012
  • Abstract
    This tutorial discusses the following:Beyond DFT: The Convergence of DFM, Variability, Yield, Diagnosis and Reliability; and Power-Aware Testing and Test Strategies for Low Power Devices.
  • Keywords
    design for manufacture; design for testability; low-power electronics; reliability; DFM; DFT; low power devices; power-aware testing; reliability; test strategy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2012 IEEE 21st Asian
  • Conference_Location
    Niigata
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4673-4555-2
  • Electronic_ISBN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2012.9
  • Filename
    6394240
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=584278