DocumentCode :
584517
Title :
Ber Analysis for Various Modulation Techniques under Diffferent Fading Environment
Author :
Jain, Manan ; Rajvanshi, Y. ; Sharma, Shantanu ; Agarwal, R.P.
Author_Institution :
Sch. of Electron. Eng., Shobhit Univ., Meerut, India
fYear :
2012
fDate :
23-25 Nov. 2012
Firstpage :
267
Lastpage :
270
Abstract :
Ever increasing demand for wireless communication and its complex nature, requires study of information at transmitting end in greater depth. This requires understanding of different ways for improving the reliability of information over the wireless channel [1]. The ways should be efficient and productive enough that it should provide minimum error transmission and it should also consider various fading models. Bit error rates are graphically displayed for different modulation schemes in different fading conditions for various values of signal to noise ratio. The results displayed in this paper give adequate idea about the best modulation scheme possible for minimum error transmission in different fading model [2].
Keywords :
error statistics; fading channels; modulation; telecommunication network reliability; BER analysis; bit error rates; error transmission; fading environment; fading models; modulation schemes; modulation techniques; reliability; signal to noise ratio; transmitting end; wireless channel; wireless communication; Communications technology; Computers; Rayleigh and Nakagami fading; Rician;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Communication Technology (ICCCT), 2012 Third International Conference on
Conference_Location :
Allahabad
Print_ISBN :
978-1-4673-3149-4
Type :
conf
DOI :
10.1109/ICCCT.2012.61
Filename :
6394710
Link To Document :
بازگشت