Title :
Dynamic Crosstalk Analysis in RLC Modeled Interconnects Using FDTD Method
Author :
Sharma, D.K. ; Mittal, Sparsh ; Kaushik, B.K. ; Sharma, Ratnesh K. ; Yadav, K.L. ; Majumder, Manoj Kumar
Author_Institution :
Nat. Inst. of Technol., Kurukshetra, India
Abstract :
Accurate time domain analysis and cross talk estimation in VLSI interconnects has emerged as an essential design criteria. This paper presents the description of a finite difference time domain (FDTD) method that is intended for estimation of voltages and currents on coupled transmission line. A numerical method based on FDTD is opted for the estimation of cross talk induced time delay in lossy RLC interconnects. Both functional and dynamic cross talk effects in coupled line configuration are analyzed. Effect of line resistance on delay is also evaluated. A linear resistive driver is used to drive distributed RLC transmission line for lossy interconnect. It has been observed that the analytical results for proposed FDTD model are in good agreement with HSPICE simulation results. The proposed model using FDTD results in an average error of 4.1% with respect to HSPICE.
Keywords :
RLC circuits; VLSI; coupled transmission lines; crosstalk; finite difference time-domain analysis; integrated circuit interconnections; integrated circuit modelling; FDTD method; HSPICE simulation; RLC modeled interconnects; VLSI interconnects; coupled transmission line; cross talk estimation; current estimation; distributed RLC transmission line; dynamic cross talk effect; dynamic crosstalk analysis; finite difference time domain method; functional cross talk effect; line resistance; linear resistive driver; lossy RLC interconnects; voltage estimation; Crosstalk; Delay; Finite difference methods; Integrated circuit interconnections; Power transmission lines; Resistance; Time domain analysis; Time domain; crosstalk; delay; finite difference time domain; interconnects; transmission line;
Conference_Titel :
Computer and Communication Technology (ICCCT), 2012 Third International Conference on
Conference_Location :
Allahabad
Print_ISBN :
978-1-4673-3149-4
DOI :
10.1109/ICCCT.2012.72