Title :
Intense focussed ion beams and their interaction with matter
Author :
Mosher, D. ; Cooperstein, G. ; Stephanakis, S.J. ; Goldstein, S.A. ; Colombant, D.G. ; Lee, Roswell
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Recent experiments and theory dealing with the production, focussing, and interaction with matter of ion beams extracted from pinched-beam diodes is reviewed. Present experiments indicate that in excess of 300 kA of .8 MeV protons can be extracted from flat anode structures while deuterons can be focussed to about 70 kA/cm2 over 2 cm2 target areas in a focussing geometry.
Keywords :
anodes; deuterons; focused ion beam technology; geometry; ion beams; pinch effect; plasma diodes; protons; current 300 kA; deuteron; electron volt energy 0.8 MeV; flat anode structure; focussing geometry; intense focussed ion beam; ion beam; matter interaction; pinched-beam diode extraction; protons; Anodes; Ferroelectric films; Geometry; Nonvolatile memory; Particle beams; Protons; Random access memory;
Conference_Titel :
Electron Beam Research & Technology, 1977 2nd International Topical Conference on
Conference_Location :
Ithaca, NY
