• DocumentCode
    584932
  • Title

    Intense focussed ion beams and their interaction with matter

  • Author

    Mosher, D. ; Cooperstein, G. ; Stephanakis, S.J. ; Goldstein, S.A. ; Colombant, D.G. ; Lee, Roswell

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    1
  • fYear
    1977
  • fDate
    3-5 Oct. 1977
  • Firstpage
    257
  • Lastpage
    274
  • Abstract
    Recent experiments and theory dealing with the production, focussing, and interaction with matter of ion beams extracted from pinched-beam diodes is reviewed. Present experiments indicate that in excess of 300 kA of .8 MeV protons can be extracted from flat anode structures while deuterons can be focussed to about 70 kA/cm2 over 2 cm2 target areas in a focussing geometry.
  • Keywords
    anodes; deuterons; focused ion beam technology; geometry; ion beams; pinch effect; plasma diodes; protons; current 300 kA; deuteron; electron volt energy 0.8 MeV; flat anode structure; focussing geometry; intense focussed ion beam; ion beam; matter interaction; pinched-beam diode extraction; protons; Anodes; Ferroelectric films; Geometry; Nonvolatile memory; Particle beams; Protons; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Beam Research & Technology, 1977 2nd International Topical Conference on
  • Conference_Location
    Ithaca, NY
  • Type

    conf

  • Filename
    6396193
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=584932