DocumentCode
585242
Title
Complex near electromagnetic field scanning on printed circuit board
Author
Xiao, Fengchao ; Takatsu, Toshihiro ; Murano, Kimitoshi ; Kami, Yoshio
Author_Institution
Dept. of Commun. Eng. & Inf., Univ. of Electro-Commun., Chofu, Japan
fYear
2012
fDate
17-21 Sept. 2012
Firstpage
1
Lastpage
4
Abstract
In this paper, a new measurement system for scanning the complex near field on a printed circuit board (PCB) is proposed. The measurement is based on the 6-port technique. The measurement results of the proposed measurement system and the measured results directly by using a VNA agree well, which confirmed the validity of the proposed measurement system.
Keywords
electromagnetic fields; measurement systems; printed circuits; 6-port technique; PCB; VNA; complex near electromagnetic field scanning; measurement system; printed circuit board; Impedance; Magnetic field measurement; Phase measurement; Power measurement; Probes; Voltage measurement; 6-port network; Quadrature hybrid; near EM-field; phase measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location
Rome
ISSN
2325-0356
Print_ISBN
978-1-4673-0718-5
Type
conf
DOI
10.1109/EMCEurope.2012.6396675
Filename
6396675
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