DocumentCode :
585570
Title :
Anode plasma and focusing in REB diodes
Author :
Goldstein, S.A. ; Swain, D.W. ; Hadley, G.R. ; Mix, L.P.
Author_Institution :
Sandia Labs., Albuquerque, NM, USA
Volume :
1
fYear :
1975
fDate :
3-5 Nov. 1975
Firstpage :
262
Lastpage :
283
Abstract :
The use of electrical, optical, x-ray, and particle diagnostics to characterize the production of anode plasma and to monitor its influence on beam generation and focusing are reviewed. Studies using the Nereus accelerator show that after cathode turn-on, deposition of several kJ/gm on the anode is necessary before ions from hydrocarbons, adsorbed gases, and heavier metallic species are detected. The actual time at which ions are liberated depends on several factors, one of which is the specific heat of the anode substrate. Once formed, anode ions cross the A-K gap (With an energy equal to the diode voltage) and interact with the cathode to produce an axially peaked beam profile, a “pinch” which does not follow the critical current criterion. Experiments with externally generated anode plasma show that this type of pinch can be attracted to localized areas on the anode. Preliminary observations on Hydra indicate the anode plasma composition is similar to that on Nereus. The effect of this plasma on pinch dynamics currently is under investigation.
Keywords :
pinch effect; plasma diagnostics; plasma diodes; plasma focus; plasma sources; A-K gap; Nereus accelerator; REB diodes; X-ray diagnostics; adsorbed gases; anode focusing; anode plasma composition; anode plasma production; anode substrate; axially peaked beam profile; beam focusing; beam generation; bydrocarbons; cathode; cathode turn-on; electrical diagnostics; externally generated anode plasma; metalic species; optical diagnostics; particle diagnostics; pinch dynamics; Abstracts; Acceleration; Anodes; Integrated circuits; Laboratories; Particle beams; Programmable logic arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Beam Research & Technology, 1975 International Topical Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-8493-6926-6
Type :
conf
Filename :
6397691
Link To Document :
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