• DocumentCode
    586524
  • Title

    Silicon Carbide — The power device for the future

  • Author

    Janzen, E. ; Kordina, Olle

  • Author_Institution
    Dept. of Phys., Chem., & Biol., Linkoping Univ., Linköping, Sweden
  • fYear
    2012
  • fDate
    25-27 Sept. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Silicon Carbide (SiC) is a wide bandgap semiconductor with highly appreciated properties making it ideal for high power, high frequency, and high temperature applications. One of these properties is the high thermal conductivity (λ) which is mentioned in almost every single publication, yet very few measurements of λ on SiC have been made and essentially no knowledge has been accumulated on the limiting factors on λ or on what role λ plays in a finished device. Improvement of λ may be achieved if the material is isotope enriched i.e. the SiC is dominatingly 28Si12C. In this paper we will highlight the properties of SiC as a power device material with specific emphasis on λ. The results from 28Si12C show that the layers are very low doped and have an isotope purity of 99% or better.
  • Keywords
    high-temperature techniques; isotopes; power apparatus; power semiconductor devices; silicon compounds; thermal conductivity; wide band gap semiconductors; 28Si12C; high frequency applications; high power applications; high temperature applications; high thermal conductivity; isotope material; isotope purity; limiting factors accumulation; low doping; power device material; wide bandgap semiconductor; Conductivity; Crystals; Schottky diodes; Silicon; Silicon carbide; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems (THERMINIC), 2012 18th International Workshop on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4673-1882-2
  • Type

    conf

  • Filename
    6400609