• DocumentCode
    586903
  • Title

    High temperature bandgap reference in PDSOI CMOS with operating temperature up to 300°C

  • Author

    Pathrose, Jerrin ; Xiaohui Gong ; Lei Zou ; Jeongwook Koh ; Chai, Kevin T. C. ; Minkyu Je ; Yong Ping Xu

  • Author_Institution
    Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2012
  • fDate
    21-23 Nov. 2012
  • Firstpage
    110
  • Lastpage
    112
  • Abstract
    This paper describes a bandgap reference with temperature range up to 300°C. Fabricated in a PDSOI CMOS technology, the bandgap reference achieves a box model temperature coefficient of 138ppm from 25 to 300°C, and line regulation less than 1.5mv/V. The minimum operating voltage is 2V and consumes merely 285μW at room temperature over several samples.
  • Keywords
    CMOS analogue integrated circuits; elemental semiconductors; silicon-on-insulator; PDSOI CMOS technology; box model temperature coefficient; high-temperature bandgap reference; line regulation; operating temperature; power 285 muW; room temperature; temperature 25 degC to 300 degC; voltage 2 V; Gain; Photonic band gap; Resistors; Temperature dependence; Temperature distribution; Temperature measurement; Voltage measurement; Bandgap Reference; High Temperature; Op-amp Offset; SOI; Temperature Compensation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology (RFIT), 2012 IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-2303-1
  • Type

    conf

  • DOI
    10.1109/RFIT.2012.6401630
  • Filename
    6401630