DocumentCode :
58714
Title :
Transconductance Linearity Analysis of 1-D, Nanowire FETs in the Quantum Capacitance Limit
Author :
Razavieh, A. ; Janes, David B. ; Appenzeller, J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
60
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
2071
Lastpage :
2076
Abstract :
The impact of channel material and dimensionality on the linearity of nanowire transistors is studied theoretically. This paper also evaluates various scattering mechanisms in this context. While operating under 1-D transport conditions in the quantum capacitance limit, the achievable device linearity strongly depends on the details of the scattering mechanisms limiting the transport. Interestingly, it is not only the scattering length that determines the third-order intercept point but also the particular energy dependence of the dominant-scattering mechanism that needs to be considered. Our results provide critical insights for the choice of material to obtain the desired device linearity.
Keywords :
field effect transistors; nanoelectronics; nanowires; scattering; 1D nanowire FET; 1D transport conditions; channel material impact; dominant-scattering mechanism; nanowire transistor linearity; quantum capacitance limit; scattering length; scattering mechanisms; third-order intercept point; transconductance linearity analysis; 1-D transport; RF linearity; ballistic transport; nanowire transistor; quantum capacitance; scattering; transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2259238
Filename :
6515592
Link To Document :
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