Title :
Edge diffraction in the scattering of focused terahertz radiation
Author :
Samoylov, L.L. ; Trukhin, V.N. ; Buyskikh, A.S. ; Horkov, D.P.
Author_Institution :
Ioffe Phys. Tech. Inst., St. Petersburg, Russia
fDate :
May 28 2012-June 1 2012
Abstract :
The terahertz (THz) near-field microscope is a powerful diagnostic test instrument for nanotechnology, allowing of measuring of spectral characteristics of objects much less than the THz wavelength. It is based on the processes of interaction between THz electric field and an object situated in the very presence of the scanning probe microscope (SPM) probe. These processes are specified by the interaction of the nanoobject under test with the near-field component of the electric field near the tip of the SPM probe which is illuminated by broadband coherent THz pulses.
Keywords :
microwave photonics; nanophotonics; scanning probe microscopy; terahertz wave devices; terahertz wave spectra; SPM probe; THz electric field; broadband coherent THz pulses; diagnostic test instrument; edge diffraction; focused terahertz radiation scattering; nanoobject; nanotechnology; near-field component; scanning probe microscopy probe; spectral characteristics; terahertz near-field microscopy; Diffraction; Electromagnetic scattering; Geometry; Microscopy; Probes; Surface waves;
Conference_Titel :
Days on Diffraction (DD), 2012
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4673-4418-0
DOI :
10.1109/DD.2012.6402781
