Title :
Testing of an off-chip NoC protocol using a BIST/Synthesizable Testbench approach
Author :
Uddin, Shahadat ; Oberg, Johnny
Author_Institution :
Dept. of Electron. Syst., R. Inst. of Technol. (KTH), Kista, Sweden
Abstract :
To make systems infinitely scalable is the holy grail of chip design and crux that needs to be solved in order to invent a sustainable design methodology. Network-on-Chip (NoC) has been suggested as this solution as it replaces the traditional buses for on-chip interconnection purposes. However, to reach infinite scalability, off-chip extensions to the NoC protocols are needed in order to maintain scalability at an affordable cost of manufacturability. Going off-chip introduces more levels of complexity when it comes to testing, not only should the chip testing be speedy, the off-chip connections must also be testable in a fast manner, the fastest way being a set of BISTs testing the whole structure in parallel. In this paper, we present a BIST approach for testing an off-chip NoC protocol used in a 4×4 Network-on-Chip configuration. It has 16 processor-nodes implemented on four interconnected plesiochronous Altera Stratix-II FPGA boards, each board hosting a Quad-core NoC.
Keywords :
network-on-chip; protocols; reliability; 16 processor-nodes; BIST-synthesizable testbench approach; chip design holy grail; four interconnected plesiochronous Altera Stratix-II FPGA boards; infinite scalability; network-on-chip; off-chip NoC protocol; off-chip extensions; quad-core NoC; Built-in self-test; Clocks; Field programmable gate arrays; Protocols; Registers; Synchronization; Built-in Self Test; Network-on-Chip; interconnect; multi-core; off-chip/inter-board NoC protocol; on-chip NoC protocol; plesiochronous clocking;
Conference_Titel :
NORCHIP, 2012
Conference_Location :
Cpenhagen
Print_ISBN :
978-1-4673-2221-8
Electronic_ISBN :
978-1-4673-2222-5
DOI :
10.1109/NORCHP.2012.6403128