DocumentCode
587849
Title
Catalyst design for native oxide based selective area InP nanowire growth
Author
Calahorra, Y. ; Greenberg, Yoko ; Cohen, Sholom ; Ritter, Daniel
Author_Institution
Dept. of Electr. Eng., Technion - Israel Inst. of Technol., Haifa, Israel
fYear
2012
fDate
27-30 Aug. 2012
Firstpage
265
Lastpage
268
Abstract
E-beam lithography based nanowire catalysts are defined by a two dimensional parameter space, spanned by metallization thickness and resist pinhole diameter. We report that native oxide based selective area nanowire growth allowed reducing the metallization thickness of catalysts down to 1/20 of the resist pinhole diameter, without thermal catalyst splitting; contrary to native oxide free nanowire growth, where catalyst splitting is a limiting effect. This parameter space allows growing similar-diameter nanowires, by two different parameter sets. In one such case, nanowires of about 50 nm grew at considerably different rates determined by the metallization thickness; indicating that at given conditions, nanowire diameter does not solely determine nanowire growth rate.
Keywords
III-V semiconductors; catalysts; electron beam lithography; indium compounds; metallisation; nanofabrication; nanolithography; nanowires; resists; 2D parameter space; E-beam lithography; InP; catalyst design; metallization thickness; nanowire catalysts; native oxide; resist pinhole diameter; selective area InP nanowire growth; thermal catalyst splitting; Gold; Lithography; Metallization; Nanoparticles; Resists; Scanning electron microscopy; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials (IPRM), 2012 International Conference on
Conference_Location
Santa Barbara, CA
ISSN
1092-8669
Print_ISBN
978-1-4673-1725-2
Type
conf
DOI
10.1109/ICIPRM.2012.6403374
Filename
6403374
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