On the error sequences of M-ary FSK modulation schemes over Nakagami-m fading channels

Author

Hogstad, B.O. ; Rafiq, Gulzaib ; Patzold, Matthias ; Crespo, P.M.

Author_Institution

CEIT, Univ. of Navarra, San Sebastián, Spain

fYear

2012

fDate

10-12 Oct. 2012

Firstpage

92

Lastpage

97

Abstract

In this paper, we have studied some important statistical properties of error sequences of M-ary orthogonal frequency-shift keying (FSK) modulation schemes over Nakagami-m fading channels. We have derived the joint probability density function (PDF) of error sequences of arbitrary length. From the joint PDF, we have found an analytical solution for the autocorrelation function (ACF) of the error sequences. The correctness of the analytical expression for the ACF of error sequences has been confirmed by simulations, where the simulation results are obtained by using the sum-of-sinusoids principle. The derived joint PDF of error sequences is useful for the development of first-order and higher-order Markov models for burst channels.

Keywords

Markov processes; Nakagami channels; frequency shift keying; probability; ACF; M-ary FSK modulation schemes; M-ary orthogonal frequency-shift keying modulation schemes; Nakagami-m fading channels; autocorrelation function; burst channels; error sequences; first-order Markov models; higher-order Markov models; joint probability density function; statistical properties; sum-of-sinusoids principle; Correlation; Fading; Frequency shift keying; Joints; Markov processes; Simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Technologies for Communications (ATC), 2012 International Conference on

Conference_Location

Hanoi

ISSN

2162-1020

Print_ISBN

978-1-4673-4351-0

Type

conf

DOI

10.1109/ATC.2012.6404237

Filename

6404237