• DocumentCode
    588129
  • Title

    An analysis of subthreshold SRAM bitcells for operation in low power RF-only technologies

  • Author

    Ledford, J. ; Gadfort, P. ; Franzon, Paul D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2012
  • fDate
    9-10 Oct. 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Current RFID systems rely on the RF transciever to transmit information and convert RF power to DC to operate any integrated digital circuits. Research investigating the application of RF signals directly on digital CMOS circuits without RF-DC conversion is an emerging area for RFID technologies. One crucial digital circuit for most RFID systems is memory, needed for storing operational instructions and sampled data. An in-depth study and comparison of subthreshold SRAM bitcells has been conducted to analyze how such memories will function in a subthreshold RF-only regime without the need for RF-DC conversion. Several SRAM cells were chosen for conversion into the RF-only family and measured against several metrics, including highest performance at lowest operating voltage, power consumption, and static noise margins (SNM). Including RF supply transistors, an 18-T subthreshold RF-only bitcell is proposed, capable of operating at a data rate of 100 kHz at VRF of 200mVRMS.
  • Keywords
    CMOS digital integrated circuits; SRAM chips; power convertors; radio transceivers; radiofrequency identification; radiofrequency integrated circuits; RF signals; RF supply transistors; RF transciever; RF-to-DC power conversion; RFID systems; SNM; SRAM cells; digital CMOS circuits; frequency 100 kHz; information transmission; integrated digital circuits; low power RF technologies; lowest operating voltage; magnetic flux density 18 T; operational instructions storage; power consumption; sampled data; static noise margins; subthreshold RF-only regime; subthreshold SRAM bitcells; voltage 200 mV; CMOS integrated circuits; Digital circuits; Noise; Radio frequency; Radiofrequency identification; Random access memory; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Subthreshold Microelectronics Conference (SubVT), 2012 IEEE
  • Conference_Location
    Waltham, MA
  • Print_ISBN
    978-1-4673-1586-9
  • Type

    conf

  • DOI
    10.1109/SubVT.2012.6404316
  • Filename
    6404316