DocumentCode :
588129
Title :
An analysis of subthreshold SRAM bitcells for operation in low power RF-only technologies
Author :
Ledford, J. ; Gadfort, P. ; Franzon, Paul D.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fYear :
2012
fDate :
9-10 Oct. 2012
Firstpage :
1
Lastpage :
3
Abstract :
Current RFID systems rely on the RF transciever to transmit information and convert RF power to DC to operate any integrated digital circuits. Research investigating the application of RF signals directly on digital CMOS circuits without RF-DC conversion is an emerging area for RFID technologies. One crucial digital circuit for most RFID systems is memory, needed for storing operational instructions and sampled data. An in-depth study and comparison of subthreshold SRAM bitcells has been conducted to analyze how such memories will function in a subthreshold RF-only regime without the need for RF-DC conversion. Several SRAM cells were chosen for conversion into the RF-only family and measured against several metrics, including highest performance at lowest operating voltage, power consumption, and static noise margins (SNM). Including RF supply transistors, an 18-T subthreshold RF-only bitcell is proposed, capable of operating at a data rate of 100 kHz at VRF of 200mVRMS.
Keywords :
CMOS digital integrated circuits; SRAM chips; power convertors; radio transceivers; radiofrequency identification; radiofrequency integrated circuits; RF signals; RF supply transistors; RF transciever; RF-to-DC power conversion; RFID systems; SNM; SRAM cells; digital CMOS circuits; frequency 100 kHz; information transmission; integrated digital circuits; low power RF technologies; lowest operating voltage; magnetic flux density 18 T; operational instructions storage; power consumption; sampled data; static noise margins; subthreshold RF-only regime; subthreshold SRAM bitcells; voltage 200 mV; CMOS integrated circuits; Digital circuits; Noise; Radio frequency; Radiofrequency identification; Random access memory; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Subthreshold Microelectronics Conference (SubVT), 2012 IEEE
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4673-1586-9
Type :
conf
DOI :
10.1109/SubVT.2012.6404316
Filename :
6404316
Link To Document :
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