• DocumentCode
    588193
  • Title

    Data intensive science at synchrotron based 3D x-ray imaging facilities

  • Author

    De Carlo, F. ; Xianghui Xiao ; Fezzaa, K. ; Wang, Shuhui ; Schwarz, N. ; Jacobsen, C. ; Chawla, Niran ; Fusseis, F.

  • Author_Institution
    Argonne Nat. Lab., Argonne, IL, USA
  • fYear
    2012
  • fDate
    8-12 Oct. 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    New developments in detector technology allow the acquisition of micrometer-resolution x-ray transmission images of specimens as large as a few millimeters at unprecedented frame rates. The high x-ray flux density generated by the Advanced Photon Source (APS) allows for detector exposure times ranging from hundreds of milliseconds to 150 picoseconds. The synchronization of the camera with the rotation stage allows a full 3D dataset to be acquired in less than one second. The micro and nano tomography systems available at the x-ray imaging beamlines of the APS are routinely used in material science and geoscience applications where high-resolution and fast 3D imaging are instrumental in extracting in situ four-dimensional dynamic information. Here we will describe the computational challenges associated with the x-ray imaging systems at the APS and discuss our current data model and data analysis processes.
  • Keywords
    X-ray detection; X-ray imaging; cameras; computerised tomography; data analysis; data models; geophysics computing; image resolution; materials science computing; synchrotrons; 3D X-ray imaging facilities; 3D dataset; APS; X-ray flux density; X-ray imaging beamlines; advanced photon source; camera synchronization; data analysis; data intensive science; data model; detector exposure times; detector technology; fast 3D imaging; geoscience applications; high-resolution imaging; in situ four-dimensional dynamic information extraction; material science; micrometer-resolution X-ray transmission image acquisition; microtomography systems; nanotomography systems; synchrotron; Cameras; Detectors; Materials; Photonics; Tomography; X-ray imaging; Data processing; tomography; x-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    E-Science (e-Science), 2012 IEEE 8th International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4673-4467-8
  • Type

    conf

  • DOI
    10.1109/eScience.2012.6404468
  • Filename
    6404468