DocumentCode :
588193
Title :
Data intensive science at synchrotron based 3D x-ray imaging facilities
Author :
De Carlo, F. ; Xianghui Xiao ; Fezzaa, K. ; Wang, Shuhui ; Schwarz, N. ; Jacobsen, C. ; Chawla, Niran ; Fusseis, F.
Author_Institution :
Argonne Nat. Lab., Argonne, IL, USA
fYear :
2012
fDate :
8-12 Oct. 2012
Firstpage :
1
Lastpage :
3
Abstract :
New developments in detector technology allow the acquisition of micrometer-resolution x-ray transmission images of specimens as large as a few millimeters at unprecedented frame rates. The high x-ray flux density generated by the Advanced Photon Source (APS) allows for detector exposure times ranging from hundreds of milliseconds to 150 picoseconds. The synchronization of the camera with the rotation stage allows a full 3D dataset to be acquired in less than one second. The micro and nano tomography systems available at the x-ray imaging beamlines of the APS are routinely used in material science and geoscience applications where high-resolution and fast 3D imaging are instrumental in extracting in situ four-dimensional dynamic information. Here we will describe the computational challenges associated with the x-ray imaging systems at the APS and discuss our current data model and data analysis processes.
Keywords :
X-ray detection; X-ray imaging; cameras; computerised tomography; data analysis; data models; geophysics computing; image resolution; materials science computing; synchrotrons; 3D X-ray imaging facilities; 3D dataset; APS; X-ray flux density; X-ray imaging beamlines; advanced photon source; camera synchronization; data analysis; data intensive science; data model; detector exposure times; detector technology; fast 3D imaging; geoscience applications; high-resolution imaging; in situ four-dimensional dynamic information extraction; material science; micrometer-resolution X-ray transmission image acquisition; microtomography systems; nanotomography systems; synchrotron; Cameras; Detectors; Materials; Photonics; Tomography; X-ray imaging; Data processing; tomography; x-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
E-Science (e-Science), 2012 IEEE 8th International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-4467-8
Type :
conf
DOI :
10.1109/eScience.2012.6404468
Filename :
6404468
Link To Document :
بازگشت