• DocumentCode
    588655
  • Title

    Targeting Specific Customer Satisfactions Issues with ODC Analysis

  • Author

    Chillarege, Ram

  • fYear
    2012
  • fDate
    27-30 Nov. 2012
  • Firstpage
    64
  • Lastpage
    64
  • Abstract
    Often, the task of quality improvement is complicated by having defect backlogs and process gaps that seem too hard to tackle in a short period of time. This is particularly true of most development organizations that have performed root cause analysis or process assessments which identify long list of potential improvement opportunities. The list include identification of one or more of a variety of issues - such as architecture weaknesses, test coverage inadequacy, inadequate regression opportunity, weak code review or inadequacy of appropriate skills.
  • Keywords
    customer satisfaction; ODC analysis; customer satisfaction; defect backlog; development organization; process assessment; process gap; root cause analysis; Abstracts; Customer satisfaction; IEEE Potentials; Organizations; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering Workshops (ISSREW), 2012 IEEE 23rd International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    978-1-4673-5048-8
  • Type

    conf

  • DOI
    10.1109/ISSREW.2012.105
  • Filename
    6405419