Title :
A 10 Gb/s voltage swing level controlled output driver in 65-nm CMOS technology
Author :
Taeho Kim ; Deog-Kyoon Jeong
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Abstract :
This paper describes the design of a 10Gb/s output driver offering a constant output voltage swing level over process, voltage and temperature (PVT) variations. Output voltage swing level can be controlled by MOS resistances in the final output driver stage. The proposed architecture employs replica output driver to compensate output voltage swing level. The gate voltage of PMOS/NMOS in the main output driver, which is generated by comparing voltage swing level of the replica driver with the desired output swing level, makes output driver voltage swing level to be constant by adjusting MOS resistances in the final stage of the output driver. The low swing output driver can be achieved by the proposed architecture; it reduces the power dissipation by reducing the voltage swing on the load. The proposed output driver is implemented using 65-nm CMOS process and operates at 10Gbps data rate over 30cm FR4-model.
Keywords :
CMOS integrated circuits; driver circuits; CMOS technology; FR4 model; MOS resistances; NMOS; PMOS; bit rate 10 Gbit/s; differential driver; gate voltage; process variation; size 30 cm; size 65 nm; temperature variation; voltage swing level controlled output driver; voltage variation; CMOS integrated circuits; Logic gates; MOS devices; Process control; Resistance; Temperature control; Voltage control; differential driver; output swing level control; process; replica output driver; signal integrity; voltage and temperature PVT insensitive; voltage-mode output driver;
Conference_Titel :
SoC Design Conference (ISOCC), 2012 International
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4673-2989-7
Electronic_ISBN :
978-1-4673-2988-0
DOI :
10.1109/ISOCC.2012.6406923