DocumentCode :
589485
Title :
Error Injection & Correction: An efficient formal logic restructuring algorithm
Author :
Ching-Yi Huang ; Daw-Ming Lee ; Chun-Chi Lin ; Chun-Yao Wang
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2012
fDate :
4-7 Nov. 2012
Firstpage :
188
Lastpage :
191
Abstract :
Redundancy Addition and Removal (RAR) and ATPG/Diagnosis-based Design Rewiring (ADDR) are both logic restructuring techniques used in the synthesis and optimization of logic designs. However, not every irredundant target wire can be successfully removed due to some limitations in these two approaches. Therefore, this paper proposes an efficient restructuring technique, Error Injection & Correction (EIC), which formally constructs a corresponding rectification network at feasible locations without verification efforts for the injected errors of the wire removal, addition, or gate replacement. We use the EIC to serve as a logic perturbation engine and combine other logic optimization engines to optimize the circuit. The experimental results show that the size of highly optimized circuits can be further reduced with this EIC technique as compared with the configuration using only logic optimization engines.
Keywords :
automatic test pattern generation; logic design; ATPG; diagnosis-based design rewiring; efficient restructuring technique; error injection & correction; formal logic restructuring algorithm; logic designs; logic optimization engines; logic perturbation engine; logic restructuring techniques; rectification network; redundancy addition and removal; Benchmark testing; Circuit faults; Engines; Integrated circuit modeling; Logic gates; Optimization; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference (ISOCC), 2012 International
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4673-2989-7
Electronic_ISBN :
978-1-4673-2988-0
Type :
conf
DOI :
10.1109/ISOCC.2012.6407071
Filename :
6407071
Link To Document :
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