DocumentCode :
589582
Title :
Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for MLC NAND flash memory
Author :
Kong, Guowei ; Kim, T. ; Xi, Wei ; Choi, Soon-Mi
Author_Institution :
Yonsei Univ., Seoul, South Korea
fYear :
2012
fDate :
Oct. 31 2012-Nov. 2 2012
Firstpage :
1
Lastpage :
5
Abstract :
Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for multi-level cell (MLC) NAND flash memory are proposed in this paper. The proposed schemes contain three signal-processing techniques, estimating cell-to-cell interference, compensating cell-to-cell interference, and generating log-likelihood ratio (LLR). Firstly, reduced symbol pattern of interfering cells is used to easily estimate cell-to-cell interference by setting threshold voltage shift to be only two values in the programming state. Based on this estimation, cell-to-cell interference is compensated by modifying the read voltage in the proposed scheme 1 and by subtracting the estimated cell-to-cell interference from the sensed voltage in the proposed scheme 2. Finally, after conducting compensation, LLR is calculated for low-density parity check codes in the assumption of free cell-to-cell interference since interference between cells is mitigated by the compensation procedure. By using these techniques, the interference can be relaxed with a simpler structure and a higher reliability compared to the conventional methods for MLC NAND flash memory.
Keywords :
NAND circuits; compensation; flash memories; parity check codes; signal processing; LLR; MLC NAND flash memory; cell-to-cell interference compensation schemes; cell-to-cell interference estimation; compensation procedure; generating log-likelihood ratio; interfering cells; low-density parity check codes; multilevel cell NAND flash memory; programming state; reduced symbol pattern; sensed voltage; signal-processing techniques; threshold voltage shift; Bit error rate; Flash memory; Interference; Parity check codes; Reliability; Sensors; Threshold voltage; Cell-to-Cell interference; MLC NAND flash memory; interference compensation; low-density parity check (LDPC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
APMRC, 2012 Digest
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4734-1
Type :
conf
Filename :
6407527
Link To Document :
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