• DocumentCode
    589583
  • Title

    A popularity-aware buffer management to improve buffer hit ratio and sequentiality for Solid State Drive

  • Author

    Qingsong Wei ; Lingfang Zeng ; Jianxi Chen ; Cheng Chen

  • Author_Institution
    Data Storage Inst., Agency for Sci., Technol. & Res. (A*STAR), Singapore, Singapore
  • fYear
    2012
  • fDate
    Oct. 31 2012-Nov. 2 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Random writes significantly limit the application of flash memory in enterprise environment due to its poor latency, shorten lifetime and high garbage collection overhead. Solid State Drive (SSD) uses a small part of memory as buffer to reduce random write and extend lifetime. Existing block-based buffer management schemes exploit spatial locality to improve the write sequentiality at a cost of low buffer hit ratio. In this paper, we propose a novel buffer management scheme referred to as PAB, which adopts both buffer hit ratio and write sequentiality as design objectives. Leveraging block popularity, PAB makes full use of both temporal and spatial localities at block level. When replacement happens, PAB selects victim block based on block popularity, page counter and block dirty flag. As universal buffer, PAB serves both read and write requests to increase the possibility to form sequential write. PAB has been extensively evaluated under real enterprise workloads. Our benchmark results conclusively demonstrate that PAB can achieve up to 72% performance improvement and 78% garbage collection overhead reduction compared to existing buffer management schemes.
  • Keywords
    buffer circuits; driver circuits; flash memories; block dirty flag; block-based buffer management; buffer hit ratio; enterprise environment; flash memory; garbage collection overhead reduction; leveraging block popularity; page counter; popularity-aware buffer management; random write; solid state drive; write sequentiality; Benchmark testing; Random access memory; Block Popularity; Buffer Management; Cache Hit Ratio; Solid State Drive; Write Sequentiality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    APMRC, 2012 Digest
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4734-1
  • Type

    conf

  • Filename
    6407528