DocumentCode
590060
Title
A study on EMC stress-strength interference model and EMC reliability
Author
Jian Wu ; Shuguo Xie ; Tenglong Ke ; Xi Chen ; Can Li
Author_Institution
Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
fYear
2012
fDate
22-26 Oct. 2012
Firstpage
677
Lastpage
680
Abstract
This paper proposed a new concept named EMC reliability to describe the capability of electromagnetic compatibility from the perspective of probability and statistics. Based on the model of EMC stress and EMC strength, an interference model between them is established to obtain the EMC reliability. The results show that this method could not only forecast the level of electromagnetic compatibility of the system effectively, but also provide a significant reference for EMC design and optimization.
Keywords
electromagnetic compatibility; electromagnetic interference; probability; reliability; stress analysis; EMC design; EMC reliability; EMC stress-strength interference model; electromagnetic compatibility; probability; Electromagnetic compatibility; Interference; Noise; Probability; Receivers; Reliability; Stress; EMC; interference model; reliability; statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas, Propagation & EM Theory (ISAPE), 2012 10th International Symposium on
Conference_Location
Xian
Print_ISBN
978-1-4673-1799-3
Type
conf
DOI
10.1109/ISAPE.2012.6408861
Filename
6408861
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