Title :
A study on EMC stress-strength interference model and EMC reliability
Author :
Jian Wu ; Shuguo Xie ; Tenglong Ke ; Xi Chen ; Can Li
Author_Institution :
Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
Abstract :
This paper proposed a new concept named EMC reliability to describe the capability of electromagnetic compatibility from the perspective of probability and statistics. Based on the model of EMC stress and EMC strength, an interference model between them is established to obtain the EMC reliability. The results show that this method could not only forecast the level of electromagnetic compatibility of the system effectively, but also provide a significant reference for EMC design and optimization.
Keywords :
electromagnetic compatibility; electromagnetic interference; probability; reliability; stress analysis; EMC design; EMC reliability; EMC stress-strength interference model; electromagnetic compatibility; probability; Electromagnetic compatibility; Interference; Noise; Probability; Receivers; Reliability; Stress; EMC; interference model; reliability; statistics;
Conference_Titel :
Antennas, Propagation & EM Theory (ISAPE), 2012 10th International Symposium on
Conference_Location :
Xian
Print_ISBN :
978-1-4673-1799-3
DOI :
10.1109/ISAPE.2012.6408861
