• DocumentCode
    59022
  • Title

    A Flexible IGZO Thin-Film Transistor With Stacked {\\rm TiO}_{2} -Based Dielectrics Fabricated at Room Temperature

  • Author

    Hsu, H.-H. ; Chang, Chih-Yung ; Cheng, Chong-hu

  • Author_Institution
    Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan
  • Volume
    34
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    768
  • Lastpage
    770
  • Abstract
    This letter demonstrates the feasibility of full room temperature InGaZnO thin-film transistor (TFT) using trilayer gate dielectric on flexible substrate. Through integrating high- \\kappa ~{\\rm SiO}_{2}/{\\rm TiO}_{2}/{\\rm SiO}_{2} (STS) gate-stack as well as InGaZnO channel thickness modulation, the resulting flexible indium–gallium–zinc oxide (IGZO)/STS TFTs show low threshold voltage of 0.5 V, small subthreshold swing of 0.129 V/decade, high field effect mobility of 76 {\\rm cm}^{2}/{\\rm Vs} , and good I_{{\\rm ON}}/I_{{\\rm OFF}} ratio of 6.7\\times 10^{5} , which have the potential for the application of high-resolution flexible display.
  • Keywords
    ${rm TiO}_{2}$; High-$kappa$ ; indium–gallium–zinc oxide (IGZO); thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2258455
  • Filename
    6515620