DocumentCode
590302
Title
Improving spatio-temporal feature extraction techniques and their applications in action classification
Author
Mesmakhosroshahi, Maral ; Joohee Kim
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear
2012
fDate
27-30 Nov. 2012
Firstpage
1
Lastpage
6
Abstract
Space-time feature extraction is a recent and popular method used for action recognition. This paper presents a new algorithm to improve the robustness of spatio-temporal feature extraction techniques against the illumination and scale variations. Most of the interest point detectors are sensitive to illumination variations that may cause serious problems in action recognition by finding wrong keypoints. A method is proposed to make the 3-D Harris corner detector robust to illumination changes. Illumination invariance is achieved by applying a contrast stretching function to the video to find the proper intensity level for each pixel. A non-uniform binning method is also proposed to make the 3-D extension of the well-known SIFT descriptor more reliable and robust to scale changes by forming orientation histograms which concentrate on the regions near the interest points. Bag of features technique is used for classifying actions provided by the KTH dataset and the results demonstrate that our proposed method outperforms the original 3-D corner detector and SIFT descriptor.
Keywords
feature extraction; image recognition; lighting; 3-D Harris corner detector; 3-D corner detector; KTH dataset; SIFT descriptor; action classification; action recognition; contrast stretching function; illumination; nonuniform binning method; orientation histograms; spatio-temporal feature extraction techniques; Accuracy; Detectors; Feature extraction; Histograms; Lighting; Robustness; Vectors; Harris corner detector; SIFT; feature descriptor; illumination invariance; interest point detector; nonuniform binning; scale invariance;
fLanguage
English
Publisher
ieee
Conference_Titel
Visual Communications and Image Processing (VCIP), 2012 IEEE
Conference_Location
San Diego, CA
Print_ISBN
978-1-4673-4405-0
Electronic_ISBN
978-1-4673-4406-7
Type
conf
DOI
10.1109/VCIP.2012.6410811
Filename
6410811
Link To Document