DocumentCode
590342
Title
Rectification by doped Mott-insulator junctions
Author
Sabou, F.C. ; Bodington, N. ; Marston, J.B.
Author_Institution
Dept. of Phys., Brown Univ., Providence, RI, USA
fYear
2012
fDate
7-9 Aug. 2012
Firstpage
1
Lastpage
4
Abstract
Junctions of doped Mott insulators offer a route to rectification at frequencies beyond the terahertz range. Mott insulators have strong electronic correlations and therefore short timescales for electron-electron scattering. It is this short time scale that allows for the possibility of rectification at frequencies well beyond those of semiconductor devices that are limited by the slow diffusion of charge carriers. We model a junction by a one dimensional chain of electrons with p- and n-doping on the two halves of the chain. Two types of systems are investigated: spin polarized electrons with nearest-neighbor interaction, and spin-half electrons that interact via on-site repulsion (the Hubbard model). For short chains the many-body Schrodinger equation can be integrated numerically exactly, and when driven by an oscillating electromagnetic field such idealized junctions rectify, showing a preferred direction for charge transfer. Longer chains are studied by the time-dependent density-matrix renormalization-group method, and also shown to rectify.
Keywords
localised states; matrix algebra; rectification; semiconductor devices; semiconductor junctions; doped Mott-insulator junctions; electromagnetic field oscillation; electron one dimensional chain; electron-electron scattering; electronic correlations; nearest-neighbor interaction; on-site repulsion; rectification; semiconductor devices; spin polarized electrons; spin-half electrons; terahertz range; time-dependent density-matrix renormalization-group method; Correlation; Hilbert space; Insulators; Junctions; Mathematical model; Numerical models; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lester Eastman Conference on High Performance Devices (LEC), 2012
Conference_Location
Singapore
Print_ISBN
978-1-4673-2298-0
Electronic_ISBN
978-1-4673-2300-0
Type
conf
DOI
10.1109/lec.2012.6410983
Filename
6410983
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