• DocumentCode
    590342
  • Title

    Rectification by doped Mott-insulator junctions

  • Author

    Sabou, F.C. ; Bodington, N. ; Marston, J.B.

  • Author_Institution
    Dept. of Phys., Brown Univ., Providence, RI, USA
  • fYear
    2012
  • fDate
    7-9 Aug. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Junctions of doped Mott insulators offer a route to rectification at frequencies beyond the terahertz range. Mott insulators have strong electronic correlations and therefore short timescales for electron-electron scattering. It is this short time scale that allows for the possibility of rectification at frequencies well beyond those of semiconductor devices that are limited by the slow diffusion of charge carriers. We model a junction by a one dimensional chain of electrons with p- and n-doping on the two halves of the chain. Two types of systems are investigated: spin polarized electrons with nearest-neighbor interaction, and spin-half electrons that interact via on-site repulsion (the Hubbard model). For short chains the many-body Schrodinger equation can be integrated numerically exactly, and when driven by an oscillating electromagnetic field such idealized junctions rectify, showing a preferred direction for charge transfer. Longer chains are studied by the time-dependent density-matrix renormalization-group method, and also shown to rectify.
  • Keywords
    localised states; matrix algebra; rectification; semiconductor devices; semiconductor junctions; doped Mott-insulator junctions; electromagnetic field oscillation; electron one dimensional chain; electron-electron scattering; electronic correlations; nearest-neighbor interaction; on-site repulsion; rectification; semiconductor devices; spin polarized electrons; spin-half electrons; terahertz range; time-dependent density-matrix renormalization-group method; Correlation; Hilbert space; Insulators; Junctions; Mathematical model; Numerical models; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lester Eastman Conference on High Performance Devices (LEC), 2012
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-2298-0
  • Electronic_ISBN
    978-1-4673-2300-0
  • Type

    conf

  • DOI
    10.1109/lec.2012.6410983
  • Filename
    6410983