• DocumentCode
    590349
  • Title

    Physics of visible and UV LED devices

  • Author

    Dobrinsky, A. ; Shatalov, M. ; Gaska, R. ; Shur, M.

  • Author_Institution
    Sensor Electron. Technol., Inc., Columbia, SC, USA
  • fYear
    2012
  • fDate
    7-9 Aug. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Large performance gap between the performance visible and deep ultraviolet light emitting diodes (DUV LEDs) is primarily attributed to material properties of high aluminum content group III-nitride semiconductor alloys used for DUV LEDs. For current state of art DUV LED devices the external quantum efficiencies (EQE) - ranges from 2% to 10%. A lower DUV LED efficiency is also due to poor transparency of semiconductor layers to UV light, poor UV light reflectivity of n-and p- contacts, low conductivity of semiconductor heterostructure, and high contact-to-semiconductor layer resistance. In this paper we discuss and compare physics of DUV LEDs and discuss the design of the next generation of DUV LEDs.
  • Keywords
    III-V semiconductors; electrical conductivity; electrical contacts; light emitting diodes; optical design techniques; reflectivity; semiconductor heterojunctions; transparency; DUV LED device; EQE; III-nitride semiconductor alloys; UV light reflectivity; deep ultraviolet light emitting diode; external quantum efficiencies; high aluminum content group; high contact-to-semiconductor layer resistance; low conductivity; material properties; n-contact; p-contact; semiconductor heterostructure; semiconductor layers; transparency; visible LED device; visible light emitting diode; Aluminum gallium nitride; Charge carrier processes; Encapsulation; Light emitting diodes; Performance evaluation; Physics; Radiative recombination; LED; Ultraviolet; external quantum efficiency; internal quantum efficiency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lester Eastman Conference on High Performance Devices (LEC), 2012
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-2298-0
  • Electronic_ISBN
    978-1-4673-2300-0
  • Type

    conf

  • DOI
    10.1109/lec.2012.6410995
  • Filename
    6410995