Characterizing WR-8 waveguide-to-CPW probes using two methods implemented within the NIST Uncertainty Framework

Author

Jargon, Jeffrey A. ; Arz, Uwe ; Williams, Dylan F.

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

fYear

2012

fDate

29-30 Nov. 2012

Firstpage

1

Lastpage

5

Abstract

We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framework. The first method consists of a two-tier approach, where a vector network analyzer (VNA) calibration is first performed in rectangular waveguide, and then a second-tier calibration is performed on-wafer. The second method determines the scattering parameters of the probes from two one-tier calibrations. We show that the two methods yield nearly equivalent results and uncertainties.

Keywords

S-parameters; calibration; coplanar waveguides; millimetre wave devices; millimetre wave measurement; network analysers; probes; rectangular waveguides; CPW; NIST Microwave Uncertainty Framework; VNA; WR-8 rectangular waveguide-to-coplanar waveguide probe; calibration; frequency 90 GHz to 140 GHz; on-wafer performance; scattering parameter; second-tier calibration; two one-tier calibration; vector network analyzer; Calibration; Microwave measurements; Microwave theory and techniques; Probes; Scattering parameters; Standards; Uncertainty; Characterize; compare; coplanar waveguide; network analyzer; probe; rectangular waveguide; uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG

Conference_Location

San Diego, CA

Print_ISBN

978-1-4673-4817-1

Electronic_ISBN

978-1-4673-4820-1

Type

conf

DOI

10.1109/ARFTG.2012.6422429

Filename

6422429