• DocumentCode
    591460
  • Title

    Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies

  • Author

    Shelton, David ; Salter, Martin ; Ridler, Nick ; Horibe, Masahiro

  • Author_Institution
    US Army Primary Stand. Lab., Redstone Arsenal, AL, USA
  • fYear
    2012
  • fDate
    29-30 Nov. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Traceability for vector network analyzer (VNA) measurements in coaxial lines smaller than 2.4 mm is problematic. The common method for traceability is to use precision coaxial air lines as primary standards. Since slotless lines are not commercially available in lines of this size, the air lines used are difficult to connect, extremely delicate, and expensive to replace. This paper describes a method of characterizing artefacts to use as standards, including specially designed and manufactured air-dielectric shielded open-circuits of various offset lengths as well as offset short-circuits and well-matched loads available in commercial VNA calibration kits. This will provide traceability using more robust and easier to use standards for calibration of the VNA. The proposed method is illustrated by measurement results obtained in 1.85 mm coaxial line (to 65 GHz.).
  • Keywords
    calibration; coaxial cables; millimetre wave devices; millimetre wave measurement; network analysers; VNA measurements; air-dielectric shielded open-circuits; artefact standards; coaxial vector network analyzer measurements; commercial VNA calibration kits; millimeter-wave frequencies; precision coaxial air lines; Atmospheric modeling; Calibration; Conductivity; Frequency measurement; Impedance; Mathematical model; Standards; Measurement standards; metrology; microwave measurements; millimeter wave measurements; transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4673-4817-1
  • Electronic_ISBN
    978-1-4673-4820-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.2012.6422430
  • Filename
    6422430