An innovative waveguide interface and quarter-wavelength shim for the 220∓325 GHz band

Author

Lau, Y.S. ; Vondran, D.J.

Author_Institution

OML, Inc., Morgan Hill, CA, USA

fYear

2012

fDate

29-30 Nov. 2012

Firstpage

1

Lastpage

4

Abstract

An innovative waveguide flange offers superior alignment based on a concentric mating mechanism consisting of a boss and jack interface. Above 100 GHz, this flange interface improves repeatability and precision of S-parameters measurements by eliminating the mechanical tolerance build-up associated with separate alignment pins. By simplifying the build-up of tolerance to only the boss and jack interface, the alignment improves match, precision, repeatability and residual calibration performance for mm-wave and sub-mm-wave S-parameter measurements. This flange is entirely compatible with the MIL-DTL-3922/67D standard. This paper presents connection repeatability for 220-325 GHz (WR-03 band). This flange is awaiting standardization in the P1785 working group of IEEE.

Keywords

S-parameters; calibration; submillimetre wave measurement; waveguides; MIL-DTL-3922-67D standard; boss interface; concentric mating mechanism; flange interface; frequency 220 GHz to 325 GHz; innovative waveguide interface; jack interface; quarter-wavelength shim; residual calibration performance; sub-mm-wave S-parameter measurements; Calibration; Flanges; Lifting equipment; Loss measurement; Millimeter wave measurements; Pins; Standards; LRL; MIL-DTL-3922/67D; Millimeter; S-parameters; TRL; shim; vector network analyzer; waveguide flange;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG

Conference_Location

San Diego, CA

Print_ISBN

978-1-4673-4817-1

Electronic_ISBN

978-1-4673-4820-1

Type

conf

DOI

10.1109/ARFTG.2012.6422431

Filename

6422431