Title :
Diagnosing the weakest link in WSN testbeds: A reliability and cost analysis of the USB backchannel
Author :
Guerrero, Pablo E. ; Gurov, Iliya ; Buchmann, Alejandro ; Van Laerhoven, Kristof
Author_Institution :
Databases & Distrib. Syst. Group, Tech. Univ. Darmstadt, Darmstadt, Germany
Abstract :
This paper highlights and characterizes the main obstacle to deploying a robust wireless sensor network testbed: the USB connections that link each of the nodes via ethernet gateways to the central server. Unfortunately, these connections are also the components that, when properly installed, can reduce testbed costs by attaching multiple nodes per gateway. After illustrating how unreliable current solutions can become (regardless of the used sensor nodes, USB cabling, or gateway setup), a set of experiments led to a list of dos and don´ts in testbed deployment. Furthermore, a simple and cost-effective suggestion is presented that allows to bypass current USB backchannel issues, leading to a more robust testbed that avoids manual maintenance of individual nodes.
Keywords :
LAN interconnection; computer network reliability; cost reduction; local area networks; peripheral interfaces; sensor placement; wireless sensor networks; Ethernet gateways; USB backchannel; USB connections; WSN testbed deployment; central server; cost analysis; reliability analysis; robust wireless sensor network testbed; testbed cost reduction; weakest link diagnosis; Logic gates; Reliability; Servers; Software; Topology; Universal Serial Bus; Wireless sensor networks; experimentation; sensor node reprogramming; testbed reliability; testbeds; universal serial bus;
Conference_Titel :
Local Computer Networks Workshops (LCN Workshops), 2012 IEEE 37th Conference on
Conference_Location :
Clearwater, FL
Print_ISBN :
978-1-4673-2130-3
DOI :
10.1109/LCNW.2012.6424085